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Theoretical study of the insulating oxides and nitrides: SiO2, GeO2, Al2O3, Si3N4, and Ge3N4

机译:绝缘氧化物和氮化物:SiO2,GeO2,Al2O3,Si3N4和Ge3N4的理论研究

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摘要

An extensive theoretical study is performed for wide bandgap crystalline oxides and nitrides, namely, SiO2, GeO2, Al 2O3, Si3N4, and Ge3N 4. Their important polymorphs are considered which are for SiO 2: α-quartz, α- and β-cristobalite and stishovite, for GeO2: α-quartz, and rutile, for Al2O 3: α-phase, for Si3N4 and Ge 3N4: α- and β-phases. This work constitutes a comprehensive account of both electronic structure and the elastic properties of these important insulating oxides and nitrides obtained with high accuracy based on density functional theory within the local density approximation. Two different norm-conserving ab initio pseudopotentials have been tested which agree in all respects with the only exception arising for the elastic properties of rutile GeO2. The agreement with experimental values, when available, are seen to be highly satisfactory. The uniformity and the well convergence of this approach enables an unbiased assessment of important physical parameters within each material and among different insulating oxide and nitrides. The computed static electric susceptibilities are observed to display a strong correlation with their mass densities. There is a marked discrepancy between the considered oxides and nitrides with the latter having sudden increase of density of states away from the respective band edges. This is expected to give rise to excessive carrier scattering which can practically preclude bulk impact ionization process in Si3N4 and Ge3N4. © Springer Science+Business Media, LLC 2007.
机译:对宽带隙晶体氧化物和氮化物,即SiO2,GeO2,Al 2O3,Si3N4和Ge3N 4进行了广泛的理论研究。考虑了它们对于SiO 2的重要多晶型物:α-石英,α-和β-方石英对于GeO2:α-石英,为金红石;对于Al2O 3:α-相,对于Si3N4和Ge 3N4:Ge-α和β-相为金红石。这项工作是对电子结构以及这些重要的绝缘氧化物和氮化物的弹性性质的综合说明,这些重要的绝缘氧化物和氮化物是根据局部密度近似值根据密度泛函理论以高精度获得的。已经测试了两种不同的守恒从头算伪电位,它们在所有方面都相符,唯一的例外是金红石型GeO2的弹性。与实验值的一致性(如果可用)被认为是非常令人满意的。这种方法的均匀性和良好的收敛性使得能够对每种材料内以及不同的绝缘氧化物和氮化物之间的重要物理参数进行无偏评估。观察到所计算的静电率与它们的质量密度显示出很强的相关性。在所考虑的氧化物和氮化物之间存在明显的差异,后者具有远离各自能带边缘的状态密度突然增加的趋势。预期这会引起过多的载流子散射,实际上会阻止Si3N4和Ge3N4中的整体碰撞电离过程。 ©Springer Science + Business Media,LLC 2007。

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    Sevik, C.; Bulutay, C.;

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  • 年度 2007
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